Texas Instruments - Automotive single positive-edge-triggered D-type flip-flop specified for partial-power-down applications (SN74LVC1G80-Q1) | Heisener Electronics
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Texas Instruments - Automotive single positive-edge-triggered D-type flip-flop specified for partial-power-down applications (SN74LVC1G80-Q1)

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Nach Datum: 2017-08-14
Texas Instruments' SN74LVC1G80-Q1 device is an AEC-Q100 qualified automotive class, with a single positive edge triggering D-type flip-flop, designed for 1.65V to 5.5V VCC operation. When the data on the data (D) input meets the settling time requirements, the data will be transferred to the Q output on the rising edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. After the hold time interval, the data at the D input can be changed without affecting the level of the output. This device is fully specified for partial power-down applications using Ioff. When the device is powered down, the Ioff circuit disables the output. This prevents current from flowing back into the device, which prevents damage to the device.